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seminario2015

Mercoledì 18 febbraio p.v. alle ore 11 il Présidente de la Société Francaise di Vide (www.vide.org), dr. Anouk Galtayries del CNRS-Chimie Paristech sarà in visita presso i laboratori della sede di Montelibretti. Alle ore 14 terrà un seminario nella Sala Riunioni dell’Istituto per lo Studio dei Materiali Nanostrutturati, sulle applicazioni del ToF-SIMS, dal titolo "Combining XPS and ToF-SIMS to investigate the surface reactivity of metal surfaces".

 

 

ABSTRACT

 

Combining XPS and ToF-SIMS to investigate the surface reactivity of metal surfaces

 

It is now possible to nicely investigate the surface chemistry of applied systems by the combination of two laboratory UHV chemical surface investigation techniques which are the X-ray Photoelectron Spectroscopy (XPS) and the Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Metallic systems are excellent materials to perform either electronic or ionic surface spectroscopies due to their good conductivity. High enough energy, mass or lateral resolutions (in case of imaging modes) can be easily reached so that we can identify chemical species (through particular binding energies in XPS or ion mass by ToF-SIMS) as well as quantitative aspects (XPS mainly), lateral distribution (ToF-SIMS imaging) or in-depth information (to 1.5 nm by ToF-SIMS, to about 10 nm by XPS until several hundreds of nanometers by XPS or ToF-SIMS depth profiles).

 

Following short reminders about these surface spectroscopies, a selection of illustrations of reaction mechanisms obtained from investigation of the surface reactivity of different metallic systems will be presented.

 

The presentation will also point the importance of defining model surfaces or model systems, so that the best investigating mode is used (high mass resolution or high lateral resolution or even the best compromise between these limits) to get as accurately as possible the best understanding of surface reaction mechanisms.

 

Institut de Recherche de Chimie Paris (UMR CNRS 8247)

 

Équipe Physico-Chimie des Surfaces

 

Chimie ParisTech (ENSCP), Paris, France

 

anouk.galtayries@chimie-paristech.fr
Présidente de la Société Française du Vide

 

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