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Researchers from CNR institutes ISOF, ICCOM and IMM, in collaboration with the university of Strasbourg, have successfully used the tip of an atomic force microscope to pattern conductive graphene pathways on an otherwise insulating graphene oxide, and to correlate the nanoscale structural and electrical features of the graphene. Micropatterned transistors based on graphene have also been produced using the same approach. The article has been just published on the first October issue of the Journal of the American Chemical Society

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